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Industrial · micro-XRF & TXRF
Bruker Nano
See what a material is made of — down to trace levels
The technology
Bruker Nano’s micro-XRF instruments reveal elemental composition non-destructively, and map how elements are distributed across a surface — not just what is present, but where. Its TXRF spectrometers (the transportable S2 PICOFOX and the automated S4 T-STAR) go the other way: they measure many trace elements at once, down to sub-ppb levels, from a tiny drop of liquid, suspension or powder, with no gases or cooling water.
Where it’s used
- Coatings and plating — thickness and composition
- Contamination and inclusion identification
- Materials verification and incoming-quality control
- Trace metals in water, wastewater and effluents (TXRF)
- Elemental impurities in pharmaceuticals, food and cosmetics (TXRF)
- Geology, mining and cultural-heritage analysis